|
|
|||
![]() |
![]() |
| University of Cambridge > Department of Engineering > Teaching Office index page > Year group page > Syllabus index page |
ENGINEERING TRIPOS PART IIB - 2012/2013
|
Leader: |
Dr A.J. Flewitt (ajf23@eng) |
|
Timing: |
Michaelmas Term |
|
Prerequisites: |
None beyond Part IB Engineering |
|
Structure: |
12 lectures + 2 examples classes + 4 hours lab (25% c/w) |
| Assessment: | Material / Format / Timing / Marks Lecture Syllabus / Written exam (1.5 hours) / Easter Term / 75 % Coursework / Laboratory write-up / Michaelmas Term / 25 % |
AIMS
Microsystems (otherwise known as MicroElectroMechanical Systems, MEMS) are mechanical devices that are fabricated on a micrometre scale using techniques more commonly associated with the semiconductor industry for the fabrication of microelectronic devices. They can be classified as either passive devices (e.g. cantilevers, beams) or actuators (e.g. electrostatic drives, thermal expansion actuators) or sensors (e.g. gyroscopes, presure sensors) and the worldwide market for these devices has expanded greatly in recent years. This course will introduce both the processing methods by which these devices are manufactured and the properties of the materials which are employed, including traditional silicon-based technology and new materials, such as diamond-like carbon, polymers and biological thin films. Case studies will be used with particular reference to one sensing and one actuating application to exemplify how materials and fabrication processes are integrated. Those interested in taking this course might also be interested in 4C15 (MEMS Mechanical Design & Dynamic Performance).
More information can be found on the 4M6 website at http://www2.eng.cam.ac.uk/~ajf/4M6
LECTURE SYLLABUS
Introduction (1L)
Materials and Growth (4L)
Materials Properties, Selection and Charcterisation (3L)
Fabrication techniques (4L)
COURSEWORK
One four hour lab session to fabricate and test a silicon nitrate cantilever. This will take place in the EDM Device Processing Clean Room. Students will be provided with a Si(100) wafer coated in silicon nitride. They will be expected to pattern the cantilever using photolithography, perform a dry RIE through the SiN layer, undercut the cantilever using a KOH etch and test the structure using a stylus profilometer.
OBJECTIVES
At the end of the module, students should:
REFERENCES
Please see the Booklist for Group R Courses for references for this module.
Last updated: June 2012
teaching-office@eng.cam.ac.uk